P. Khakbaz , F. Driussi , A. Gambi , P. Giannozzi , S. Venica, D. Esseni, A. Gahoi, S. Kataria, and M.C. Lemme
DOI: 10.1109/SISPAD.2019.8870456
https://air.uniud.it/bitstream/11390/1168467/1/08870456.pdf
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD (2019)
